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Testing
and Evaluation of E-O Imaging Systems
COURSE
DESCRIPTION:
This course will describe all the quantitative
and qualitative metrics that are used to
characterize imaging system performance.
These includes resolution, responsivity,
the aperiodic transfer function, the slit
response function, random noise, uniformity,
fixed pattern noise, modulation transfer
function, contrast transfer function, and
the minimum resolvable contrast. Since all
imaging system spatially sample the scene,
sampling artifacts occur in all imagery.
Sampling effects become evident when viewing
test targets such as bar patterns.
BENEFITS:
This course will enable to you to:
- Write concise test procedures with unambiguous
system specifications.
- Identify all appropriate test parameters.
- Differentiate between observer variability
and system response during MRC and MRT
testing.
- Understand how jitter, linearity, amplitude
normalization, frequency scaling and noise
affect CTF and MTF measurements.
- Discern the difference between poor
system performance, peculiarities of the
system under test and measurement errors.
- Understand how sampling affects test
results
INTENDED AUDIENCE:
The course is for managers, specification
writers and test engineers involved with
all phases of imaging system characterization
ranging from satisfying customer requirements
to insuring that specifications are unambiguous
and testable.
RECOMMENDED TEXT:
Testing and Evaluation of Infrared Imaging
Systems, second edition, by Gerald C. Holst,
JCD Publishing (1998)
TYPICAL COSTS:
Call 407-629-5370 for additional information
and pricing or e-mail
us. |
